LDMOS

  • 网络横向扩散金属氧化物半导体(laterally-diffused metal oxide semiconductor);Lateral Diffused Metal Oxide Semiconductor;横向扩散金属氧化硅

LDMOSLDMOS

LDMOS

横向扩散金属氧化物半导体(laterally-diffused metal oxide semiconductor)

横向扩散金属氧化物半导体(LDMOS)晶体管具有低成本和大功率的优势,非常适合于现代蜂窝基站PA设计。对线性度、效率 …

Lateral Diffused Metal Oxide Semiconductor

LDMOSLateral Diffused Metal Oxide Semiconductor)即:横向扩散金属氧化物半导体。起初,LDMOS技术是为900MHz蜂 …

横向扩散金属氧化硅

Xilinx:词汇表 ... LCA fileFPGA 实现文件。 LDMOS 横向扩散金属氧化硅(场效应晶体管) LDT 查看 闪电数据传输 ...

横向扩散金氧半电晶体

横向扩散金氧半电晶体(LDMOS)因为与标准CMOS制程有很高的相容性,因此广泛地被应用在中电压之智慧型功率电路中。当 …

横向扩散金氧半场效电晶体

国立清华大学机构典藏 National Tsing... ... 电子工程研究所 GH029663553 横向扩散金氧半场效电晶体 LDMOS 戴冠宇 Tai,Kua…

横向扩散金属氧化物监视

· 放大器尺寸比使用硅双极结晶体管(Si BJT)或横向扩散金属氧化物监视(LDMOS)器件的产品减小50%封装和供货: 2729GN-50…

1
The invention provides an LDMOS device capable of improving breakdown voltage and a manufacturing method thereof. 本发明提供了一种可提高击穿电压的LDMOS器件及其制造方法。
2
This model is an aid to understand the device physics during on-state accurately and it also directs high voltage LDMOS design. 该模型有助于深入理解LDMOS开态击穿的物理过程,可用于指导高压LDMOS的设计。
3
The relation between the maximum temperature and the switching condition of an LDMOST under different frequencies is studied. 研究了LDMOS器件内部的最高温度与开关频率之间的关系。
4
The compatibility of BCD process integration was discussed. We focused on the principle and concerns on LDMOS technology. 对BCD工艺兼容性进行了说明,着重阐述了LDMOS的工艺原理和关键工艺设计考虑。
5
The methods for every resistance are given out in details according to the structure of LDMOS. 根据LDMOS的结构特点分别给出了各个电阻的具体计算方法。
6
The process for this new structure is compatible with the normal P type LDMOS. 根据以上结构制定新工艺,该工艺与常规P型LDMOS兼容。
7
An accurate expression of LDMOS on-resistance is obtained in the end. 最后给出了精确的LDMOS导通电阻表达式。
8
Design and Implementation of a High-Voltage LDMOS Operational Amplifier 一种LDMOS高压运算放大器的设计与实现
9
An Analytical Model of a LDMOS On-Resistance Using a Well as a High Resistance Drift Region 用阱作高阻漂移区的LDMOS导通电阻的解析模型
10
Influence of Gate Voltages on Temperature of LDMOS Under Ultra-High Transient Currents 栅压对LDMOS在瞬态大电流下工作的温度影响